FISCHERSCOPE X-RAY MODULAR CHAMBER
Measuring on large workpieces: large special housing for integrating Fischer X-ray measurement technology.
Learn moreModern software for XRF devices: up to 6 times faster thickness measurement and up to 13 times faster material analysis.

FISIQ X is the latest software for Fischer XRF instruments. A simple, modern interface, guided workflows and an improved algorithm engine shorten calculation time (up to 6 times for coating thickness and up to 13 times for material analysis compared with WinFTM 6). An AI-supported spectrum mode is available. It runs on FISCHERSCOPE XDAL and XDV devices.
- Simple, modern user interface
- Guided, efficient workflows
- Various user roles
- AI-supported spectrum mode
Measuring on large workpieces: large special housing for integrating Fischer X-ray measurement technology.
Learn moreShaping and focusing X-rays with glass capillaries, developed and produced by Fischer in Germany.
Learn moreCustomised system solutions for metrology: automated, semi-automated or stand-alone, with Fischer measurement technology.
Learn moreSend an enquiry and we will respond with a tailored quotation or advice.