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Helmut Fischer · Analytics

FISIQ X

Modern software for XRF devices: up to 6 times faster thickness measurement and up to 13 times faster material analysis.

FISIQ X

FISIQ X

FISIQ X is the latest software for Fischer XRF instruments. A simple, modern interface, guided workflows and an improved algorithm engine shorten calculation time (up to 6 times for coating thickness and up to 13 times for material analysis compared with WinFTM 6). An AI-supported spectrum mode is available. It runs on FISCHERSCOPE XDAL and XDV devices.

Key features

- Simple, modern user interface
- Guided, efficient workflows
- Various user roles
- AI-supported spectrum mode

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