FISCHERSCOPE X-RAY XDV-µ PCB
The professional series for PCBs: reliable, fully automatic measurement of the smallest structures.
Learn moreFISCHERSCOPE XDV-µ PCB XL
From large-scale PCBs to the finest structures: manual, semi-automatic or fully automatic measurement with maximum throughput.
FISCHERSCOPE XDV-µ PCB XL
The XDV-µ PCB XL is a highly precise XRF benchtop instrument designed specifically to measure coating thicknesses and small structures on large-scale PCBs with maximum throughput.
Key features
- One-time positioning for maximum throughput
- Manual, semi-automatic or fully automatic operation
- FISIQ X software: modern interface, guided workflows and faster analysis
Technical data
- Measuring method
- X-ray fluorescence (XRF)
- Application
- Large-scale printed circuit boards (PCB)
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