FISCHERSCOPE X-RAY XDV-µ LD
Smallest measuring spot at the largest measuring distance: for measuring the smallest components.
Learn moreSmallest measuring spot, highest precision: for very small, flat components and multilayer systems.

The FISCHERSCOPE X-RAY XDV-µ is a universal instrument for measuring on very small, flat components and structures as well as complex multilayer systems. Polycapillary optics provide a very small measuring spot.
- In-house polycapillary optics: Fischer is the only XRF manufacturer producing its own polycapillary lenses
- DPP+ signal processing: up to 50 % better repeatability or significantly shorter measuring times
- Three optic options for different tasks
- FISIQ X software: modern interface, guided workflows and faster analysis
Smallest measuring spot at the largest measuring distance: for measuring the smallest components.
Learn moreThe professional series for PCBs: reliable, fully automatic measurement of the smallest structures.
Learn moreSpecialised solution for automated measurement of thin films and multilayer systems on 6–12 inch wafers.
Learn moreSend an enquiry and we will respond with a tailored quotation or advice.