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Helmut Fischer · Analytics

FISCHERSCOPE X-RAY XDV-µ

Smallest measuring spot, highest precision: for very small, flat components and multilayer systems.

FISCHERSCOPE X-RAY XDV-µ

FISCHERSCOPE X-RAY XDV-µ

The FISCHERSCOPE X-RAY XDV-µ is a universal instrument for measuring on very small, flat components and structures as well as complex multilayer systems. Polycapillary optics provide a very small measuring spot.

Key features

- In-house polycapillary optics: Fischer is the only XRF manufacturer producing its own polycapillary lenses
- DPP+ signal processing: up to 50 % better repeatability or significantly shorter measuring times
- Three optic options for different tasks
- FISIQ X software: modern interface, guided workflows and faster analysis

Technical data

Measuring method
X-ray fluorescence (XRF)
Optics
Polycapillary: 10 µm halo-free, 20 µm halo-free or 20 µm halo
Detector
SDD

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