FISCHERSCOPE X-RAY XDV-µ
Smallest measuring spot, highest precision: for very small, flat components and multilayer systems.
Learn moreSmallest measuring spot at the largest measuring distance: for measuring the smallest components.

The XDV-µ LD is a high-end XRF instrument with polycapillary X-ray optics for measuring the smallest components with the smallest measuring spot and the largest measuring distance in its class.
- In-house polycapillary optics: Fischer is the only XRF manufacturer producing its own polycapillary lenses
- DPP+ signal processing: up to 50 % better repeatability or significantly shorter measuring times
Smallest measuring spot, highest precision: for very small, flat components and multilayer systems.
Learn moreThe professional series for PCBs: reliable, fully automatic measurement of the smallest structures.
Learn moreSpecialised solution for automated measurement of thin films and multilayer systems on 6–12 inch wafers.
Learn moreSend an enquiry and we will respond with a tailored quotation or advice.