FISCHERSCOPE X-RAY XDAL 600
Thin films, trace elements and alloys: universal XRF for the smallest structures and coatings up to 0.1 µm.
Learn moreFISCHERSCOPE XDAL
The best detectors for thin layers: benchtop XRF instrument for coatings below 0.05 µm and analysis in the ppm range.
FISCHERSCOPE XDAL
The FISCHERSCOPE XDAL is an innovative benchtop instrument for measuring the thickness of very thin and complex coatings, even below 0.05 µm, and for material analysis in the ppm range. The new generation combines a fast Z-axis, an improved camera and FISIQ X software.
Key features
- Highly precise, repeatable results thanks to optimised measurement geometry
- High-speed Z-axis for sample positioning
- FISIQ X software: modern interface, guided workflows and faster analysis
Technical data
- Autofocus
- in under 2 s (14× faster*)
- Z-axis
- High-speed (6× faster*)
- Camera
- 10× higher resolution*, multizone LED lighting
- Hood
- Automated or manual
- Status light
- 180° status light
- Layer range
- Thin and very thin layers < 0.05 μm
- Large parts
- C-slot for large parts
- Software
- FISIQ X
- Note
- * compared with the previous model
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FISCHERSCOPE X-RAY XDAL-PCB
Universal XRF for small structures, multilayer and functional coatings and thin coatings below 0.1 µm.
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FISCHERSCOPE X-RAY XDAL
Universal XRF instrument for automated measurement of thin and very thin layers below 0.05 µm and analysis in the ppm range.
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