FISCHERSCOPE X-RAY XDAL 600
Thin films, trace elements and alloys: universal XRF for the smallest structures and coatings up to 0.1 µm.
Learn moreFISCHERSCOPE X-RAY XDAL-PCB
Universal XRF for small structures, multilayer and functional coatings and thin coatings below 0.1 µm.
FISCHERSCOPE X-RAY XDAL-PCB
The XDAL-PCB is a universal XRF instrument for measuring small structures, multilayer coatings, functional coatings and thin coatings below 0.1 µm, including on printed circuit boards.
Key features
- 4-fold changeable apertures and 3-fold changeable filters
- Large silicon drift detector for very good detection accuracy and high resolution
Technical data
- Measuring spot
- Smallest approx. Ø 0.2 mm
- Detector
- Silicon drift detector (SDD)
- Coating thickness
- Below 0.1 µm
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