FISCHERSCOPE X-RAY XDAL 600
Thin films, trace elements and alloys: universal XRF for the smallest structures and coatings up to 0.1 µm.
Learn moreFISCHERSCOPE X-RAY XDAL
Universal XRF instrument for automated measurement of thin and very thin layers below 0.05 µm and analysis in the ppm range.
FISCHERSCOPE X-RAY XDAL
The FISCHERSCOPE X-RAY XDAL is a universal instrument for automated measurement of thin and very thin layers below 0.05 µm and for material analysis in the ppm range.
Key features
- Measuring distance adjustment via the patented DCM method
- Type-approved full protection device: safe operation without additional measures
- Completely automatable
Technical data
- Measuring method
- X-ray fluorescence (XRF)
- Coating thickness
- Below 0.05 µm
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