FISCHERSCOPE X-RAY XDL / XDLM

FISCHERSCOPE X-RAY XDL / XDLM

FISCHERSCOPE X-RAY XDL, XDLM and XDAL are energy-dispersive X-ray fluorescence (ED-XRF) instruments for non-destructive coating thickness measurement and material analysis. Several versions with different X-ray sources, filters and detectors let you choose the unit that fits your measurement task.

Strengths

- adjustable measuring distance of up to 80 mm, suited to PCBs and irregularly shaped parts
- optional motorised XY stage and Z-axis for automated measurement
- XDAL uses a silicon drift detector (SDD) with high energy resolution for very thin layers

Applications

- coating thickness on large panels, flexible PCBs and 3D samples
- analysis of galvanic baths
- functional coatings in electronics and semiconductors, hard coatings (CrN, TiN, TiCN)

Technical data

Measuring method

Energy-dispersive X-ray fluorescence (ED-XRF)

Measuring distance

Adjustable, up to 80 mm

Automation

Optional motorised XY stage and Z-axis

Detector

SDD on the XDAL model