Au / Pd coatings in the nm range on printed circuit boards
Measuring very thin gold and palladium coatings on printed circuit boards with X-ray fluorescence, and how different detectors compare for trueness and repeatability.
Measuring coatings and composition on circuit boards, connectors and semiconductors.
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Measuring very thin gold and palladium coatings on printed circuit boards with X-ray fluorescence, and how different detectors compare for trueness and repeatability.
Comparing X-ray fluorescence instruments with two other methods on gold coatings of only a few nanometres on leadframes.
Checking the thickness of conformal coatings that protect electronics against moisture, dust, chemicals and temperature extremes.
Measuring both thickness and phosphorus content of NiP layers on connectors and tiny PCB structures with the XDV-µ.
Checking the composition of lead-free solder bumps (e.g. SnAgCu) in semiconductor packaging to ensure solderability.
Checking the composition of lead-free solder bumps (e.g. SnAgCu) in semiconductor packaging to ensure solderability.
Non-destructive measurement of copper in holes of 0.8–1.2 mm diameter on multilayer PCBs with a dedicated probe.
Non-destructive measurement of copper in holes of 0.8–1.2 mm diameter on multilayer PCBs with a dedicated probe.
Measuring the hardness of very thin gold coatings on printed circuit board traces by indentation at tiny loads and travel distances.
Measuring the hardness of very thin gold coatings on printed circuit board traces by indentation at tiny loads and travel distances.
Coulometry measures the remaining pure tin in coatings on printed circuit boards, which decides lead-free solderability.
Coulometry measures the remaining pure tin in coatings on printed circuit boards, which decides lead-free solderability.
Measuring non-conductive solder resist over copper with a high-frequency probe of low eddy-current depth, to prevent solder bridging and short circuits.
Measuring non-conductive solder resist over copper with a high-frequency probe of low eddy-current depth, to prevent solder bridging and short circuits.
Fast, precise, non-destructive coating thickness measurement on standard printed circuit boards with the X-RAY PCB instrument line.
Fast, precise, non-destructive coating thickness measurement on standard printed circuit boards with the X-RAY PCB instrument line.
Monitoring thickness and composition in thin-film solar module production (CIS/CIGS, CdTe) with X-ray heads fitted to vacuum chambers.
Monitoring thickness and composition in thin-film solar module production (CIS/CIGS, CdTe) with X-ray heads fitted to vacuum chambers.
Analysing solder composition with the XDAL to confirm the Pb content where lead is still permitted because of tin whiskers.
Analysing solder composition with the XDAL to confirm the Pb content where lead is still permitted because of tin whiskers.
Automatic alignment of measuring points on large boards, removing the need to position manually on tiny contact pads (XRF).
Automatic alignment of measuring points on large boards, removing the need to position manually on tiny contact pads (XRF).
Mobile checking of copper thickness (start copper and end copper) during production, at goods-in and outgoing with the SR-SCOPE.
Overview of the XULM-PCB and XDLM-PCB measuring systems for coating thickness and composition analysis on boards up to 610 × 610 mm (PDF in Slovenian).
Non-destructive measurement of composition and layer thickness of Cu-In-Ga-Se and Mo on solar cells by energy-dispersive X-ray fluorescence; thickness repeatability below 0.5 %.
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