FISCHERSCOPE X-RAY XDV-µ
Smallest measuring spot, highest precision: for very small, flat components and multilayer systems.
Learn moreFISCHERSCOPE X-RAY XDV-SDD
Powerful universal XRF instrument for very thin or complex layers and RoHS screening at very low detection limits.
FISCHERSCOPE X-RAY XDV-SDD
The FISCHERSCOPE X-RAY XDV-SDD is a high-end all-rounder for inspecting very thin or complex layers and for RoHS screening at very low detection limits.
Key features
- DPP+ signal processing: up to 50 % better repeatability or significantly shorter measuring times
- 4-fold changeable apertures
- 6-fold changeable filters
- WinFTM software: complete support for measurement, calibration and statistical evaluation
Technical data
- Measuring method
- X-ray fluorescence (XRF)
- Detector
- Silicon drift detector (SDD)
- Application
- Thin layers, RoHS screening
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