FISCHERSCOPE XDV

FISCHERSCOPE XDV

The FISCHERSCOPE XDV is a high-end all-round benchtop X-ray fluorescence instrument for measuring the thickness of very thin and complex coatings, even in the nanometre range, and for material analysis in the ppm range. The new generation is built for speed, precision and ease of use.

Key features

- The Z-axis for sample positioning is up to 6 times faster (compared with XDV-SDD)
- Autofocus in under 2 seconds
- Automated or manual hood for flexible operation
- Camera with 10 times higher resolution and multi-zone LED lighting
- Optimised measurement geometry for highly precise, repeatable results
- 180° status light that always shows the device state
- FISIQ X software: modern interface, guided workflows and faster analysis

Technical data

Autofocus

in under 2 s (14× faster*)

Z-axis

High-speed (6× faster*)

Camera

10× higher resolution*, multizone LED lighting

Hood

Automated or manual

Status light

180° status light

Layer range

Thin and very thin layers < 0.05 μm

Software

FISIQ X

Note

* compared with the previous model